(invited) Research in the Future Metrology Hub, Materials in Manufacturing the Future

(keynote) Precision Metrology: from bulk optics towards metasurface optics

(poster) Metalenses for Metrological Applications

(poster) Ultra-compact metrology systems using nanophotonics elements

(poster) Ultra-compact metasurface spectrometer for metrology

(poster) Miniaturizing Focus Variation Sensors for Optical Metrology Using Metalenses

Metalenses for Metrological Applications

Ultra-Compact Metrology Systems using Nanophotonics Elements

Optimised design of a metasurface-based spectrometer for industrial applications