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Towards metasurfaces for metrological applications

(poster) Exploiting optical metasurfaces to create ultra-compact instrumentation for metrology

Picophotonics: Sub-Brownian detection of nanowire position with atomic-scale resolution using topologically structured light

3D position nanometrology of a coronavirus-like nanoparticle with topologically structured light

Experimental observations of thermal fluctuations of metamaterial optical properties

Metasurface-based ultracompact instrumentation to support future smart manufacturing

Coordinate nanometrology of coronavirus-like nanoparticle with topologically structured light

Thermal fluctuations in the optical properties of dielectric and plasmonic nanomechanical metamaterials

(keynote) Optical metrology with sub-atomic resolution

(plenary) The molecular level metrology and imaging with topological light and free electrons

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Centre for Precision Technologies
EPSRC Future Metrology Hub
School of Computing and Engineering
Haslett Building 3/14
University of Huddersfield
Huddersfield
West Yorkshire
HD1 3DH

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metrology@hud.ac.uk
01484 257 076