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metrology@hud.ac.uk
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(poster) Miniaturizing Focus Variation Sensors for Optical Metrology Using Metalenses
(invited) Superoscillation and super-resolution
Non-contact optical magnetic field sensor based on metamaterial nanomechanics
Metalenses for Metrological Applications
Ultra-Compact Metrology Systems using Nanophotonics Elements
Optimised design of a metasurface-based spectrometer for industrial applications
Towards metasurfaces for metrological applications
Optical superoscillation technologies beyond the diffraction limit
(poster) Exploiting optical metasurfaces to create ultra-compact instrumentation for metrology
Thermal fluctuations of the optical properties of nanomechanical photonic metamaterials
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