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metrology@hud.ac.uk
01484 257 076
Haydn Martin
Nikolay Zheludev
Eric Plum
Retrieving positions of closely packed sub-wavelength nanoparticles from their diffraction patterns
Nonclassical spin-multiplexing metasurfaces enabled multifunctional meta-scope
2D super-resolution metrology based on superoscillatory light
3D positional metrology of a virus-like nanoparticle with topologically structured light
Near-infrared metalens empowered dual-mode high resolution and large FOV microscope
Tunable on-chip optical traps for levitating particles based on single-layer metasurface
Shape classification of objects too small to see
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