Improving Fisher information flow in picometric optical metrology

Controlling Fisher information flow in sub-atomic precision optical metrology

Smaller objects can be resolved with higher resolution

Super-resolution imaging of limited-size objects

Optical localization nanometrology

Optical ruler

Motion visualization in electron microscopy

Resolving complex subwavelength grating structures using topologically structured light

Electron-beam-controlled volatile nanomechanical bistability

Control of nanomechanical resonances by an electron beam